MindMap Gallery Overview of X-ray Absorption Fine Structure (XAFS) Technology

Overview of X-ray Absorption Fine Structure (XAFS) Technology

This mind map provides an overview of X-ray Absorption Fine Structure (XAFS) technology, encompassing XAFS types, basic principles, and instrumentation. XAFS technology is divided into XANES (X-ray Absorption Near Edge Structure) and EXAFS (Extended X-ray Absorption Fine Structure), which are used to study the local environment and long-range structural information around atoms, respectively. The basic principles are based on the fine structure of absorption edges generated by the interaction of X-rays with matter, revealing electronic structures and chemical bond information of materials. Instrumentation involves X-ray sources, detectors, and data processing systems, collectively forming the XAFS experimental platform.

Edited at 2024-12-17 06:39:11
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Overview of X-ray Absorption Fine Structure (XAFS) Technology

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